Products

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Nano Scan Technologies Ltd. develops, produces and sales scanning probe microscopes (SPM, atomic force microscopes - AFM) for scientific and applied research applications, also combined with optical microscopes, spectral devices (AFM Raman) and ultramicrotomes. Design principles of NST devices allow easy change and modification of SPM type. Same device with minimal modifications can be used for a number of SPM modes such as scanning tunnel, atomic force, electric force, scanning Kelvin probe, magnetic force, magnetic resonance force, scanning capacitance, scanning Hall probe and electrochemical scanning tunnel microscopy as well as for nanolithography applications.

 

 

Basic NST products include:

Product Description Price

ARS 3000

Confocal scanning Raman  spectrometer.
Optical microscope.
Confocal laser microscope.
Confocal fluorescence microscope.
Scanning probe microscope (atomic force microscope);
Raman scattering spectrometer c high spectral resolution;

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30 000 000 RUR

Certus Light V

Scanning probe microscope (atomic force microscope).
A complete set of SPM techniques.
Scanning by sample.
Exact positioning of the sample.
Built-in optical microscope for surface observation and alignment of the AFM head.

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5 000 000 RUR

Certus Standard V

Scanning probe microscope (atomic force microscope).
A complete set of SPM techniques.
Scanning by sample.
Exact positioning of the sample.
Professional optical microscope for surface observation and alignment of the AFM head
Completely automated.

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8 000 000 RUR

Certus Light

Scanning probe microscope (atomic force microscope);
A complete set of SPM techniques.
Scanning with a probe (scanning head).
Exact positioning of the sample.

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5 000 000 RUR

Ratis


Piezo stage.
Fully independent X, Y, Z axes.
No crosstalk.
Hi stifness.
Built in optical sensors with absolute callibration.

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1 500 000 RUR

Certus Optic U

 

Scanning probe microscope (atomic force microscope);
A complete set of SPM techniques.
Scanning by sample.
Exact positioning of the sample.
Scientific Optical microscope for surface observation and alignment of the AFM head
Completely automated.

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15 000 000 RUR
Scanning probe microscope (atomic force microscope);
A complete set of SPM techniques.
Scanning by sample.
Exact positioning of the sample.
Scientific Optical microscope for surface observation and alignment of the AFM head
Completely automated.

More Information...

15 000 000 RUR