Ratis SPM_B XYZ - an improved model of the scanning piezo stage, with increased rigidity, allows to scan at a higher speed and quality of SPM applications.
Piezo stages are made of solid metal part processed with EDM wire-cutting and precise CNC machining. Movable central part hangs on flexible springs and is driven with piezo actuators. Ratis design provides excellent linearity and flatness of the movement, in contrast to the classical scanners based on piezoelectric tubes, where the scan surface is a sphere. In addition, plane-parallel scanners have higher mechanical strength, compared with fragile piezoelectric tubes.
Ratis SPM_B XYZ multi-axes scanners are equipped with capacitive displacement sensors for digital closed-loop control. It provides high accuracy and linearity of movement and eliminates the creep effect of piezoceramics. Capacitance measurements are made with TDC (time-to-digital conversion) technology where all measuring electronics is located as close as possible to the sensors. Such a design leads to the low noise and high speed displacement control.
Applications of Ratis XY(Z) include scanning probe microscopy (e.g. atomic force microscopy), nanopositioning, metrology, biology research, microelectronics, micromanipulation etc.
|Parameters||Ratis SPM_B XYZ
|XY travel range, µm||50×50|
|Z range, µm||15|
|Resonant frequency XY, kHz||1|
|Resonant frequency Z, kHz||50|
|Minimum scan step, nm||0.1|
|Angle tilting over the full range, nm||< 0.01°|
|Maximum scanning speed, Hz (line/sec)||50|
|Base sample weight, g||100|
|Operating temperature range||at -40°C to 80°C|
|Clear aperture diameter, mm||nono|