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Si/SiO2 test grating. AFM Image. Contact mode. Topography.

Vanadium test grating NSpec (confocal image)

Si/SiO2 test grating,  laser confocal image

Test grating. AFM image. Semi-contact mode. Topography.

 

Si/SiO2 test grating. AFM Image. Contact mode. Topography.

Si/SiO2 test grating. AFM Image. Contact mode. Topography.

Si/SiO2 test grating. AFM image. Images was obtained with  SPM Certus Standard. Contact mode. Topography.

Bottom right image - profile in cross-sectoin of test grating.

Test Si/SiO2 gratings are used for setup and calibration of scanning probe microscopes. They are produced by different methods. However, the most common - lithography. Via test gratings can calibrate scanning probe microscopes, so that would be measured by its parameters from the actual objects on the axes X,Y,Z. In addition to the test gratings verify linearity scanning systems.



Si/SiO2 grating. Profile in cross section

Vanadium test grating - Gwyddion (confocal image)

Vanadium test grating NSpec (confocal image)

Vanadium test grating. Images was obtained with AFM-Raman-Confocal system Centaur in laser confocal microscope mode.

Vanadium test gratings containing rhombic elements bulge on the surface. Such gratings is used to calibrate the confocal microscopes and SNOM or A-SNOM.

Si/SiO2 test grating,  laser confocal image

Si/SiO2 test grating, raman confocal image

Si/SiO2 test grating. Images was obtained with AFM-Raman-Confocal system Centaur in laser confocal microscope mode (left) and Raman confocal microscope mode (right). Simultaneous laser and Raman confocal images.

Image size 100х100 μm. 100х100 points.

Test grating and probe.

The Si/SiO2 periodic structure and probe.

Image was obtained with video microscope of SPM Certus Standart.

Test grating. AFM image. Semi-contact mode. Topography. Test grating. AFM image. Semi-contact mode. "Phase".
Test grating. AFM image. Semi-contact mode. Topography 3D. Test grating. AFM image. Semi-contact mode. Topography and cross-section.
Test grating. AFM image. Semi-contact mode. Topography. Profile in cross-section.

Si/SiO2 test grating. AFM image. Images was obtained with  SPM Certus Standard. Contact mode. Semi-contact mode.

Image size 60х60 μm. 300х300 points.

Upper left image - topography. Upper right image - "Phase".

Lower left image - topography 3D. Lower right images - topography, cross-section and profile in cross-section.

Test grating. AFM image. Semi-contact mode. Topography. Test grating. AFM image. Semi-contact mode. "Phase".
Test grating. AFM image. Semi-contact mode. Topography 3D. Test grating. AFM image. Semi-contact mode. Topography and cross-section.
Test grating. AFM image. Semi-contact mode. Topography. Profile in cross-section.
Si/SiO2 test grating. AFM image. Images was obtained with  SPM Certus Standard. Contact mode. Semi-contact mode.

Image size 30х30 μm. 600х600 points.

Upper left image - topography. Upper right image - "Phase".

Lower left image - topography 3D. Lower right images - topography, cross-section and profile in cross-section.

Vanadium test grating. NSOM image. Vanadium test grating. AFM image. Topography.

Vanadium test grating. Images was obtained with NSOM/Snom system Certus NSOM O. Тransmitted light. Simultaneous AFM and NSOM images.

Image size 50х50 μm. 256х256 points.

Upper left image - near-field image. Upper right image - AFM image, topography.

Lower right image - topography 3D (AFM).

Vanadium test gratings containing rhombic elements bulge on the surface. Such gratings is used to calibrate the confocal microscopes and SNOM or A-SNOM.

Vanadium test grating. AFM image. Topography 3D.

 

ДНК на слюде.

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